Make impedance movement visible
A Smith chart helps turn complex reflection data into a visual tuning path.
- Plot S11 and S22 movement
- Inspect frequency markers
- Compare matching changes
- Keep Smith and rectangular plots connected
Smith chart
Use Smith chart views to inspect impedance trajectories, S-parameter behavior, return loss, matching targets, and component tuning effects.

Capture, ports, labels, reusable sheets, and touch-friendly editing.
Waveforms, measurements, markers, RF traces, and tuning feedback.
S-parameters, return loss, insertion loss, Smith chart, gain, and stability.
Tune components and compare response changes without leaving the workspace.
A Smith chart helps turn complex reflection data into a visual tuning path.
The Smith chart is part of the measurement workflow, not a standalone calculator isolated from the circuit.
Related engineering routes
ECAD workspace
Create circuit schematics, run SPICE-compatible analysis, inspect S-parameters and Smith charts, and tune component values across tablet and desktop.
Simulation
Prepare analog circuits for AC and transient analysis, inspect waveforms, add measurements, and tune component values in the Tersa EDA workflow.
RF analysis
Inspect S11, S21, S12, S22, return loss, insertion loss, stability, gain, and marker-driven RF measurements in Tersa EDA.
Tool directory
Explore Tersa EDA tools for schematic editing, SPICE-compatible simulation, S-parameter analysis, Smith charts, RF measurements, and component tuning.
Related workflows
Move between matching theory, a practical Tersa workflow, S-parameter analysis, and Smith chart inspection.
RF engineering guide
Learn a repeatable RF impedance matching workflow using complex impedance, S11, return loss, Smith charts, reactive networks, and bandwidth checks.
Application workflow
Follow a practical Tersa EDA workflow: prepare RF ports, run an S-parameter sweep, inspect S11 on a Smith chart, tune L and C, and verify bandwidth.
RF engineering library
Practical material about impedance matching, S-parameters, Smith charts, frequency response, and repeatable RF tuning workflows.
FAQ
It is used to inspect impedance trajectories, reflection behavior, and matching changes.
Yes. The page is linked to the RF S-parameter workflow.